Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 1
EDX and EELS Chemical Analysis with a Probe Corrected STEM
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 972-973
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Models of Magnesium Oxide (111) Surface Reconstructions Obtained from Direct Phasing of Transmission Electron Diffraction Data
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 1039-1040
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Studies of Supported Metal Catalysts Using Low Voltage Biased Secondary Electron Imaging in a JSM-6320f Fe-SEM
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- 02 July 2020, pp. 1223-1224
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The Use of a Cold Gas Plasma for the Final Processing of Contamination-Free TEM Specimens
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- 02 July 2020, pp. 985-986
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Large-Format Direct Detection Camera for Cryo-EM at 100 keV
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 1172-1173
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Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM
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- 08 April 2017, pp. 920-921
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Characterizing InGaAs/GaAs quantum dots using low-kV FESEM imaging and EDS analysis at the nanometer scale
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 1586-1587
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TEM thin film analysis of chemically deposited YBa2Cu3O7-x coated conductors
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- 07 September 2007, pp. 412-413
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Combining Orientation Mapping andIn SituTEM to Investigate High-Cycle Fatigue and Failure
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- 25 July 2016, pp. 1736-1737
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Evolution of Microstructure and Precipitation State During Thermomechanical Processing of a Low Carbon Microalloyed Steel
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- 28 September 2012, pp. 119-120
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Micro-Analytical study of a rare papier-mâché sculpture
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- 10 September 2015, pp. 138-139
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Femto-second laser applications in energy materials characterization
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 2456-2457
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SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 2319-2320
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In Situ 4D-STEM
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- 30 July 2020, pp. 934-935
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Quantification of the Resolved Phase Change in Reconstructed Electron Exit Waves of Gold [110] in Different Electron Microscopes
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- 01 August 2002, pp. 466-467
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Highly Depth-sensitive TEM Imaging of Graphene by using Monochromatic Electron Source at Low Accelerating Voltage
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- 01 August 2018, pp. 1610-1611
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Optimized Electron Column and Detection Scheme for Advanced Imaging and Analysis of Metals
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- 27 August 2014, pp. 1102-1103
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Automatic Diffraction Analysis and Lattice Fitting for Convergent-Beam Electron Diffraction Patterns in 4D-STEM
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- 30 July 2021, pp. 1280-1281
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In situ HRTEM of a Catalyst Using a Nanoreactor at 1 bar
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- 09 April 2017, pp. 536-537
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In Situ Investigation of the Carbothermal Reduction of ZnO Nanowires
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1554-1555
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