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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Controlling the Reaction Process in Operando STEM by Pixel Sub-Sampling

Computational Methods for Large Scale Scanning Transmission Electron Microscopy (STEM) Experiments and Simulations

Optimization of Image Contrast for Size Distribution Measurements of Nanomaterials by Transmission Electron Microscopies Including TEM and T-SEM

Studying Electrocatalyts in Operando Conditions: Correlating TEM Imaging and X-Ray Spectroscopies

Low Loss EELS of Lateral MoS2/WS2 Heterostructures

Direct-write Focused Ion Beam Lithography

Correlative Workflow in the Characterization of Advanced Coatings

Microscopy of Oxide Nanoparticles for Energy Applications

Depth Sectioning of Individual Dopant Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy

Virtual Scanning Electron Microscope: Learning and Training

Observation of Solid-Liquid Interfacial Reactions Controlled Bulk Phase Transition of Ni-rich Layered Cathode

A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors

Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM

Very Large Area EDS Spectral Images: Impact of Latest Silicon Drift Detector Technology

Metallographic Research of the Pressure Effect on the Final Microstructure of Eutectic Al-Si Alloys

Non-Conductive Specimens and Prevention of Electron Beam Charging

TEM and STEM Tomography for thick polymer sample

A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data

Curiosity Rover Mars Hand Lens Imager (MAHLI) Views of the Sediments and Sedimentary Rocks of Gale Crater, Mars

WetSEM: Cell Surface Characteristics as Reporters for Cellular Energy State

Microscopy and Microanalysis

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