Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T21:28:09.346Z Has data issue: false hasContentIssue false
  • English
  • Français

Refined Phase Imaging by Electron Diffractive Imaging

Published online by Cambridge University Press:  25 July 2016

Jun Yamasaki ,
Yuki Shimaoka  and
Hirokazu Sasaki
Jun Yamasaki
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Osaka, Japan
Yuki Shimaoka
Affiliation:
Graduate School of Engineering, Osaka University, Ibaraki, Osaka, Japan
Hirokazu Sasaki
Affiliation:
Furukawa Electric Co., Ltd, Yokohama, Kanagawa, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1614 - 1615
Copyright
© Microscopy Society of America 2016 

References

[1] Morishita, S., Yamasaki, J., et al, Appl. Phys. Lett 93 (2008) 183103.CrossRefGoogle Scholar
[2] Morishita, S., Yamasaki, J., et al, AMTC Lett 2 (2010) 116.Google Scholar
[3] Yamasaki, J., et al, Appl. Phys. Lett 101 (2012) 234105.Google Scholar
[4] Yamasaki, J., et al, AMTC Lett 3 (2012) 164.Google Scholar
[5] Morishita, S., Yamasaki, J., et al, J. Electron Microsc 60 (2011) 101.Google Scholar
[6] Morishita, S., Yamasaki, J., et al, Ultramicrosc 129 (2013) 10.Google Scholar
[7] The present study was partly supported by JSPS KAKENHI (Grant No. 26286049, 26105009 and 21760026), MEXT KAKENHI (Grant No. 26600042), The Public Foundation of Chubu Science and Technology Center, and Toyoaki Scholarship Foundation.Google Scholar