Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-29T08:59:58.918Z Has data issue: false hasContentIssue false

Measuring Orbital Angular Momentum (OAM) and Torque Transfer from Polarization Vortices with the Electron Microscopy Pixel Array Detector

Published online by Cambridge University Press:  04 August 2017

Kayla X Nguyen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Michael C. Cao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Prafull Purohit
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY, USA
Ajay K. Yadav
Affiliation:
Department of Material Science and Engineering, University of California, Berkeley
Javier Junquera
Affiliation:
Department of Physics, University of Cantaberia, Spain
Mark W. Tate
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY, USA
Ramamoorthy Ramesh
Affiliation:
Department of Material Science and Engineering, University of California, Berkeley
Sol M. Gruner
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NYUSA Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY, USA Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NYUSA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Yadav, A. K., et al, Nature 530 2016). p 198.CrossRefGoogle Scholar
[2] Uchida, M., et al, Nature 464 2010). p 737.CrossRefGoogle Scholar
[3] Verbeeck, J., et al, Nature 467 2010). p 301.CrossRefGoogle Scholar
[4] Tate, W. M., et al, Microscopy and Microanalysis 22 2016). p 237.CrossRefGoogle Scholar
[5] Supported by NSF MRSEC program (DMR 1120296), Kavli Institute at Cornell.Google Scholar