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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Rapid In Situ Melting and Revitrification as an Approach to Microsecond Time-Resolved Cryo-Electron Microscopy

After Capture: Fundamentals of Images, their Storage, Visualization, Processing and Quantification

Three Dimensional Parallel Automated Segmentation of Neural Soma in Large KESM Images of Brain Tissue

Techniques for Transmission EBSD Mapping of Atom Probe Specimens

Focused Ion Beam Slice-and-View Tomography and Correlative Electron Microscopy of Multiphase Meteorite Particles

In Situ TEM Study of the Annealing of Titania Nanotubes for Use as Novel Electrochemistry Based Water Purification Devices

Metallographic Preparation of Space Shuttle Reaction Control System Thruster Electron Beam Welds for Electron Backscatter Diffraction

Freeze Substitution and Low Temperature Processing of Cryo Protected Tissues into Lowicryl HM23 Resin for Correlated Light and Immunogold Electron Microscopy in Drug Discovery and Safety Assessment Research

Custom Scan Control and Time Resolved Signal Acquisition for High Resolution SEM Imaging

Structure-Transport Properties of Topological Nanowires

Label-free Imaging of Stem Cell Adhesion and Dynamic Tracking of Boundary Evolution Using Photonic Crystal Enhanced Microscopy (PCEM)

Fabrication and Simultaneous Electrical Measurement of Graphene Nanoribbon Devices Inside a S/TEM

Analysis of Cellulose Acetate Membranes for Lab-on-a-Chip Applications

Cathodoluminescence Microanalysis of Amorphised Quartz

Choice of Specimen Thickness in Axial Bright-Field STEM Tomography of Cells

Predicting the Electronic Structure of CeO2 Grain Boundaries for Comparison with Atomic Resolution EELS

Low Temperature Electron Microscopy of “Charge-Ordered” Phases

Investigation of the Atomic and Electronic Structure of β-(Al0.2Ga0.8)2O3 Alloys by STEM-EELS

Advanced quality control scanning system for electronic materials

Characterization of Mn oxides using “flank” method in SEM-SXES system

Microscopy and Microanalysis

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