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Characterization of Mn oxides using “flank” method in SEM-SXES system

Published online by Cambridge University Press:  30 July 2021

Yohei Kojima
Affiliation:
JEOL, Ltd., Akishima, Tokyo, Japan
Natasha Erdman
Affiliation:
JEOL USA Inc, Peabody, Massachusetts, United States

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Takahashi, H., et al. , IOP Conf. Ser.: Mater. Sci. Eng., (2016) 109 012017CrossRefGoogle Scholar
Hofër, H., et al. , Eur. J. Mineral., (1994) 6 407-418.CrossRefGoogle Scholar
Hofër, H. and Brey, G. P., Am. Mineral., (2007) 92 873-885.CrossRefGoogle Scholar