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Low Temperature Electron Microscopy of “Charge-Ordered” Phases

Published online by Cambridge University Press:  05 August 2019

Ismail El Baggari ,
David J. Baek ,
Benjamin H. Savitzky ,
Michael J. Zachman ,
Robert Hovden  and
Lena F. Kourkoutis
Ismail El Baggari*
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA.
Benjamin H. Savitzky
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
Michael J. Zachman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Robert Hovden
Affiliation:
Department of Materials Science & Engineering, University of Michigan, Ann Arbor, MI, USA.
Lena F. Kourkoutis*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.
*
*Corresponding authors: [email protected] & [email protected]
*Corresponding authors: [email protected] & [email protected]

Abstract

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Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 934 - 935
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yankovich, A. B., et al. , Nat. Commun. 5 (2014), p. 4155.Google Scholar
[2]El Baggari, I., et al. , Proc. Natl. Acad. Sci. 115, 1445 (2018), p. 1445-1450.Google Scholar
[3]Savitzky, B. H., et al. , Ultramicroscopy 191 (2018), p. 56-65.Google Scholar
[4]Soumyanarayanan, A., et al. , Proc. Natl. Acad. Sci. 110 (2013), p. 1623-1627.Google Scholar
[5]Feng, J., et al. , Appl. Phys. Lett. 109 (2016), 021901.Google Scholar
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[7]Goff, R. J., Attfield, J. P., Phys. Rev. B 70 (2004), p. 140404.Google Scholar
[8]This work was supported by AFOSR (FA 9550-16-1-0305), NSF (DMR-1539918, DMR-1429155, DMR-1719875), and the Packard Foundation.Google Scholar