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Fabrication and Simultaneous Electrical Measurement of Graphene Nanoribbon Devices Inside a S/TEM

Published online by Cambridge University Press:  23 September 2015

Julio A. Rodriguez-Manzo ,
Zhengqing John Qi ,
Matthew Puster ,
Adrian Balan ,
A. T. Charlie Johnson  and
Marija Drndic
Julio A. Rodriguez-Manzo
Affiliation:
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, USA.
Zhengqing John Qi
Affiliation:
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, USA.
Matthew Puster
Affiliation:
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, USA. Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, USA.
Adrian Balan
Affiliation:
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, USA.
A. T. Charlie Johnson
Affiliation:
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, USA.
Marija Drndic
Affiliation:
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1155 - 1156
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Puster, M., et al, ACS Nano 7 (2013) 11283.Google Scholar
[2] Qi, Z. J., et al, Nano Letters 14 (2014) 4238.CrossRefGoogle Scholar
[3] This work was supported by NIH grants R21HG004767 and R01HG006879, and NBIC through NSF NSEC DMR08-32802. JZQ and CJ acknowledge SRC contract #2011-IN-2229, NSF AIR Program ENG-1312202. Part of this work was done at the CFN in BNL, supported by the U.S. DOE, Contract No. DE-AC02-98CH10886 (FEI-Titan ACTEM through proposal 31972).Google Scholar