Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Solid-state X-ray Spectrometry at 50 Years

Abstract

Next for EDS? SDD Arrays, GeDDs, and a 40-Year Paradigm Overturned

X-ray Microanalysis at High Count Rate with Latest Generation Silicon Drift Energy Dispersive Spectrometer

Very Large Area EDS Spectral Images: Impact of Latest Silicon Drift Detector Technology

Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry

Check of the Performance of EDS Systems Attached to the SEM with the Test Material EDS-TM001/2 and Evaluation Software Package EDS Spectrometer Test -Application, Experiences and Updates

The Standard-based f-ratio Quantitative X-Ray Microanalysis Method for a Field Emission SEM

The P/B-Method, About 50 Years a Hidden Champion

Applications of Combined Transmission Kikuchi Diffraction and STEM-SDD X-Ray Analysis in Irradiated Materials

Electron Probe Micro-Analysis at Low Accelerating Voltages: The Impacts of Surface Coatings and Oxide Layers on Quantification

Monte Carlo Simulation of Surface Semi-Spherical Inclusions Using MC X-ray

ζ–Factor Development and Quantification of a Boron Carbide and Silicon Hexaboride Diffusion Couple

Lithium Detection in a Binary Al-20 wt% Li Alloy Powder with a New Windowless SDD EDS Detector and EELS

Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES

Comparison and Combination of Energy and Wavelength Dispersive X-Ray Spectrometry in Electron Probe Microanalysis of Minerals and Glasses

Exploring the Limits of EDS Microanalysis for Rare Earth Element Analyses

An Open Evaluation of Hyperspectral Unmixing Strategies for EDS Analysis

Advances in SDD-based EDS and Comparisons to WDS for Light Element Sensitivity

SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios

Measurement of Elemental Composition of FeNi and SiGe Thin Films by Electron Probe Microanalysis with Stratagem Software

Microstructure Characterization of Microalloyed 5xxx Aluminum Alloys with Er and Zr using Analytical Transmission Electron Microscopy and Synchrotron X-ray Fluorescence Microscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Solid-state X-ray Spectrometry at 50 Years

Abstract