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The Standard-based f-ratio Quantitative X-Ray Microanalysis Method for a Field Emission SEM

Published online by Cambridge University Press:  01 August 2018

Chaoyi Teng ,
Hendrix Demers  and
Raynald Gauvin
Chaoyi Teng
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
Hendrix Demers
Affiliation:
Centre d’excellence en electrification des transports et stockage d'energie, Hydro-Quebec, Varennes, Quebec, Canada, J3X 1S1
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 732 - 733
Copyright
© Microscopy Society of America 2018 

References

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