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Exploring the Limits of EDS Microanalysis for Rare Earth Element Analyses

Published online by Cambridge University Press:  01 August 2018

Nicholas W.M. Ritchie  and
Heather A. Lowers
Nicholas W.M. Ritchie
Affiliation:
Microscopy and Microanalysis Research Group, NIST, Gaithersburg, MD
Heather A. Lowers
Affiliation:
Central Minerals and Environmental Resources Science Center, U.S. Geological Survey, Denver, CO

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 750 - 751
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Reed, S J B Ware, N G X-ray Spectrometry 2 1973) p. 69.Google Scholar
[2] Schamber, F H A modification of the linear least-squares fitting method which provides continuum suppression (Ann Arbor Science Publishers) 1977) p 241.Google Scholar
[3] Drake, M Weill, D Chemical Geology 10 1972) p. 79.Google Scholar
[4] Newbury, D E Ritchie, N W Journal of Materials Science 50 2015) p. 493.Google Scholar