Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract

The Effects of Evactron® Plasma Cleaning on Moxtek® X-ray Windows

EDS and VP-SEM: Practical Considerations and Challenges

Crystal Grain Observation Using a Segmented Backscattered Electron Detector

Beam Deceleration Leads to Superior Image Quality of Biological Samples Analyzed in the Scanning Electron Microscope

Facets on Spherical Particles in Al65Cu20Fe15 Alloy

Electron/Ion Channeling Contrast Imaging and Grayscale Image Analysis Using 3C-SiC Twin Structures

High-Temperature BSE and EBAC Electronics for ESEM

Effective Degradation of Humic Acids in Water by Zero Fenton Process

Sensitivity Analysis of Simulated Backscattered Electron Emission against Electron Dosage of Buried Semiconductor Features

Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy

Scanning Electron Microscope, an Essential Equipment for Failure Analysis

Solid-state X-ray Spectrometry at 50 Years

Abstract

The Beginnings of EDS in EPMA

The Early Days of EDS Development (and One Questionable Legacy)

Uncertainty Propagation for Energy Dispersive X-ray Spectrometry

CUBE: The SDD Preamplifier For Excellent Energy-Resolution and High Count-Rate Performance

Comprehensive Quantitative Elemental Microanalysis with Electron-Excited Energy Dispersive X-ray Spectrometry (EDS): 50 Years Young and Getting Better Every Day!

Using Micro-Beam Techniques to Infer Meteorite Abundances of the Jurassic

Coordinated Nano-Scale EDS and EELS Measurements of Lunar Space-Weathered Material

Chemical Compound Classification by Elemental Signatures in Castle Dust Using SEM Automated X-ray Particle Analysis

The Maia Detector Journey: Development, Capabilities and Applications

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract

Solid-state X-ray Spectrometry at 50 Years

Abstract