Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage

A Unique Approach for Preparing Cross-Sectional EM Study of Textile Fibers

The NanoWorkstation: Complementing FIB-SEM Tools with Micromanipulators

Characterization of the CIGS Solar Cell System in the FIB-SEM Laboratory

NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples

Technical Refinement of the Orage Ga-FIB column and Optimizing its Control for Routine Analytical Tasks

Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices

Coloring with Focused Ion Beam Fabricated Nanostructures

Investigation of slice thickness for FIB tomography in a plasma focused ion beam system

Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Pushing the Limits of Cryo-EM

Abstract

Advanced Data Acquisition From Electron Microscopes With SerialEM

A Complete Workflow for Cellular Tomography and Subtomogram Averaging in EMAN2

Algorithmic Advances in Single Particle Cryo-EM Data Processing

To Cryo-Cycle or Not to Cryo-Cycle; That is the Question!

CryoET of Single Particle CryoEM Grids Reveals Widespread Particle Adsorption to the Air-Water Interface, Which May be Reduced with New Plunging Techniques

Zooming in on Cell Architecture and Molecular Structures with Correlative Light and Electron Microscopy

Cryo-STEM Imaging of Ribosomes Using the Electron Microscope Pixel Array Detector

The Potential for Greater Clarity Cryo-Electron Microscopy via Ptychography

Determining and Controlling the Surface Properties of Cryo-EM Specimen Supports

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

Pushing the Limits of Cryo-EM

Abstract