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Next for EDS? SDD Arrays, GeDDs, and a 40-Year Paradigm Overturned
Published online by Cambridge University Press: 01 August 2018
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 722 - 723
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- © Microscopy Society of America 2018
References
[2] Schamber, F., et. al
U.S. Patent Appl. No. 15/224,628, Pub. No. US 2018/0033589 A1, (2018).Google Scholar
[4] Lowe, B. G.
Sareen, R. A. in Semiconductor X-Ray Detectors. CRC Press
Boca Raton
p 266.Google Scholar
[7] “Scanning Electron Microscopy and X-Ray Microanalysis”, ed. Goldstein et al, 4th ed. (Springer Nature, New York).Google Scholar
[9] The author gratefully acknowledges Owen E. Healy, who analyzed the data in Figure 2 and refused to succumb to proof by appeal to authority. You were right. It just took a while to figure out why.Google Scholar
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