Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-17T22:22:02.838Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Temperature BSE and EBAC Electronics for ESEM

Published online by Cambridge University Press:  01 August 2018

Wolfgang Joachimi ,
Matthias Hemmleb ,
Uwe Grauel ,
Zhu-Jun Wang ,
Marc Willinger  and
Grigore Moldovan
Wolfgang Joachimi
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany
Matthias Hemmleb
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany
Uwe Grauel
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany
Zhu-Jun Wang
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany
Marc Willinger
Affiliation:
Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Berlin, Germany Scientific Center for Optical and Electron Microscopy-ScopeM, ETH Zurich, Zurich, Switzerland
Grigore Moldovan
Affiliation:
point electronic GmbH, Erich-Neuß-Weg 15, Halle, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 694 - 695
Copyright
© Microscopy Society of America 2018 

References

[1] Wang, Z.-J., et al, ACS Nano 9 2015) p. 1506.Google Scholar
[2] Poitel, S., et al, ECS Trans. 78(1 2017) p. 1615.Google Scholar
[3] Hemmleb, M., et al, EMC Proc 2016) p. 489.Google Scholar