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The Effects of Evactron® Plasma Cleaning on Moxtek® X-ray Windows

Published online by Cambridge University Press:  01 August 2018

Ewa Kosmowska ,
Josh Wong ,
Michael Almond ,
Barbara Armbruster  and
Ronald Vane
Ewa Kosmowska
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA
Josh Wong
Affiliation:
Moxtek Inc., Orem, UT, USA
Michael Almond
Affiliation:
Moxtek Inc., Orem, UT, USA
Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 682 - 683
Copyright
© Microscopy Society of America 2018 

References

[1] Kosmowska, E., et al, Microsc. Microanal. 23(Suppl. 1 2017) p. 74.Google Scholar
[2] Vane, R. Moore, C.A. Microsc. Microanal 20(Suppl. 3 2014) p. 2014.Google Scholar
[3] Vane, R., et al, Microsc. Microanal 10(Suppl. 2 2004) p. 966.Google Scholar