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Comprehensive Quantitative Elemental Microanalysis with Electron-Excited Energy Dispersive X-ray Spectrometry (EDS): 50 Years Young and Getting Better Every Day!

Published online by Cambridge University Press:  01 August 2018

Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Fitzgerald, R., KeilR., K. R., K. Heinrich, K. Science 525 1968) p. 159.Google Scholar
[2] Goldstein, J., etal in “Scanning Electron Microscopy and X-ray Microanalysis, 4th ed Springer New York.Google Scholar
[3] Xiaobing, L., et al, Micros. Microanal 19(S2 2013) p. 1136.Google Scholar
[4] Newbury, D. Ritchie, N. J. Mats. Sci. 50 2015) p. 493.Google Scholar
[5] Newbury, D. Ritchie, N. Micros. Microanal 21 2015) p. 1327.Google Scholar
[6] Newbury, D. Ritchie, N. Micros. Microanal 22 2016) p. 520.Google Scholar
[7] Ritchie, N., Newbury, D. Davis, J. Micros. Microanal 18 2012) p. 892.Google Scholar
[8] Newbury, D. Ritchie, N. Micros. Microanal 22 2016) p. 735.Google Scholar
[9] Newbury, D. Ritchie, N. Micros. Microanal 22(S2 2016) p. 396.Google Scholar
[10] Ritchie, N. DTSA-II available free at: www.cstl .nist. gov/div837/837. 02/epq/dtsa2/index.html.Google Scholar