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Electron/Ion Channeling Contrast Imaging and Grayscale Image Analysis Using 3C-SiC Twin Structures

Published online by Cambridge University Press:  01 August 2018

Tomoko Borsa  and
Bart Van Zeghbroeck
Tomoko Borsa
Affiliation:
Nanomaterials Characterization Facility, University of Colorado Boulder, Boulder, USA
Bart Van Zeghbroeck
Affiliation:
Dept. of Electrical, Computer and Energy Engineering, University of Colorado Boulder, Boulder, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 692 - 693
Copyright
© Microscopy Society of America 2018 

References

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