Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-23T17:02:59.360Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron/Ion Channeling Contrast Imaging and Grayscale Image Analysis Using 3C-SiC Twin Structures

Published online by Cambridge University Press:  01 August 2018

Tomoko Borsa  and
Bart Van Zeghbroeck
Tomoko Borsa
Affiliation:
Nanomaterials Characterization Facility, University of Colorado Boulder, Boulder, USA
Bart Van Zeghbroeck
Affiliation:
Dept. of Electrical, Computer and Energy Engineering, University of Colorado Boulder, Boulder, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 692 - 693
Copyright
© Microscopy Society of America 2018 

References

[1] Spence, J. C. H. in Electron Diffraction Techniques Volume 1” (ed. J. M. Cowley Oxford University Press New York p. 465.Google Scholar
[2] Picard, Y. N. Twigg, M. E. J. Appl. Phys. 104 2008) p. 124906.Google Scholar
[3] Zaefferer, S. Elhami, N.-N. Acta Materialia 75 2014) p. 20.Google Scholar
[4] Yahiro, Y., et al, J. Electron Microsc. 53 2004) p. 571.Google Scholar
[5] Franklin, R. E., et al, J. Mater. Sci. Lett. 7 1988) p. 39.Google Scholar
[6] Borsa, T., et al, Microanal 23(Suppl 1 2017) p. 576.Google Scholar
[7] Barr, D. L. Brown, W. L. J. Vac. Sci. Technol. B 13 1995) p. 2580.Google Scholar