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Characterization of BiVO4 Powders and Thin Films by Electron Microscopy and Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  04 August 2017

H. A. Calderon ,
F. Toma ,
J. K. Cooper ,
I. D. Sharp ,
P. Ercius ,
O. Cigarroa  and
E. Neri
H. A. Calderon
Affiliation:
Depto. Fisica, Instituto Politecnico Nacional - ESFM, UPALM Zacatenco Ed. 9, CDMX, Mexico.
F. Toma
Affiliation:
Chemical Sciences Division and JCAP, LBNL, Berkeley CA, USA.
J. K. Cooper
Affiliation:
Chemical Sciences Division and JCAP, LBNL, Berkeley CA, USA.
I. D. Sharp
Affiliation:
Chemical Sciences Division and JCAP, LBNL, Berkeley CA, USA.
P. Ercius
Affiliation:
Molecular Foundry-NCEM, LBNL, Berkeley CA, USA.
O. Cigarroa
Affiliation:
Depto. Fisica, Instituto Politecnico Nacional - ESFM, UPALM Zacatenco Ed. 9, CDMX, Mexico.
E. Neri
Affiliation:
Depto. Fisica, Instituto Politecnico Nacional - ESFM, UPALM Zacatenco Ed. 9, CDMX, Mexico.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1822 - 1823
Copyright
© Microscopy Society of America 2017 

References

[1] Rossell, M. D., et al, Chemistry of Materials 27 2015). p. 3593.Google Scholar
[2] Cooper, J. K., et al, Chemistry of Materials 28 2016). p. 5761.CrossRefGoogle Scholar
[3] HAC acknowledges support of CONACYT (FOINS 75 2012/75) and IPN (COFAA-SIP). Work at the Molecular Foundry is supported by the Office of Science, the Office of Basic Energy Sciences, the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar