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Revealing the Structure of Graphitic Carbon Nitride through Low-Dose TEM using a Direct Electron Detector

Published online by Cambridge University Press:  04 August 2017

Diane M. Haiber  and
Peter A. Crozier
Diane M. Haiber
Affiliation:
School for Engineering of Matter, Transport & Energy, Arizona State University, Tempe, Arizona, USA
Peter A. Crozier
Affiliation:
School for Engineering of Matter, Transport & Energy, Arizona State University, Tempe, Arizona, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1808 - 1809
Copyright
© Microscopy Society of America 2017 

References

[1] Wang, X., et al, Nat. Mater. 8 2009). p. 76.CrossRefGoogle Scholar
[2] Lotsch, B.V., et al, Chem. Eur. J 13 2007). p. 4969.CrossRefGoogle Scholar
[3] Haiber, D.M., et al, Microsc. Microanal. 22(Suppl 3 2016). p. 986.CrossRefGoogle Scholar
[4] Support from the U.S. DOE (DE-SC0004954), use of AC-TEM at the John M. Cowley Center for High Resolution Electron Microscopy, use of the K2 IS camera courtesy of Gatan, and use of XRD equipment within the LeRoy Eyring Center for Solid State Science at ASU are gratefully acknowledged.Google Scholar