Microscopy and Microanalysis: Volume 14 - Issue S2

< Back to all issues

Volume 14 - Supplement S2 - August 2008

Contents

Page 32 of 41

Atom-Probe Analysis of Non-traditional Materials

Research Article

LA-WATAP and SIMS as Complementary Techniques for Quantitative Measurement of Nnanometer Structures
L Renaud, I Martin, A Merkulov, P Peres, R Benbalagh, M Schuhmacher
Published online by Cambridge University Press:

03 August 2008, pp. 1242-1243
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A New Approach for the Mass Analysis of Biomolecules at Atomic Level Utilizing the Scanning Atom Probe
O Nishikawa, M Taniguchi
Published online by Cambridge University Press:

03 August 2008, pp. 1244-1245
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Site Specific Atom Probe Analysis from Ceramic, Geologic and Bio-Materials
RL Martens, MG Thompson, GB Bersch, M Forseth, R Knutson
Published online by Cambridge University Press:

03 August 2008, pp. 1246-1247
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Discovery of 250 Ma Cellulose Fibers in a Deep Permian Halite Layer Poses Unique Challenges in TEM Imaging and Analysis
J Griffith, S Willcox, DW Powers, R Nelson, BK Baxter
Published online by Cambridge University Press:

03 August 2008, pp. 1248-1249
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Identification and Analysis of Fluorine Clustering in Boron Implants
DA Reinhard, D Lawrence, RA Alvis, P Ronsheim
Published online by Cambridge University Press:

03 August 2008, pp. 1250-1251
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Diffusion of TaN and HfO into TiN in a Metal Gate Stack
D Reinhard, D Lawrence, D Olson, R Alvis
Published online by Cambridge University Press:

03 August 2008, pp. 1252-1253
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Bulk Dielectrics with Atom Probe Tomography
DJ Larson, RL Alvis, DF Lawrence, TJ Prosa, RM Ulfig, DA Reinhard, PH Clifton, SSA Gerstl, JH Bunton, DR Lenz, TF Kelly, K Stiller
Published online by Cambridge University Press:

03 August 2008, pp. 1254-1255
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

New Analytical Techniques in Microbeam Analysis

Research Article

Celebrating EDS Technology - 30 Years of Turning Photons into Minerals
AR Butcher, P Gottlieb
Published online by Cambridge University Press:

03 August 2008, pp. 1256-1257
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SLICE, A Database Approach to EDS
DC Ward, J Colby
Published online by Cambridge University Press:

03 August 2008, pp. 1258-1259
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors
T Elam, R Anderhalt, A Sandborg, J Nicolosi, D Redfern
Published online by Cambridge University Press:

03 August 2008, pp. 1260-1261
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Anomalous X-ray Emission from Insulator Materials Associated with Low Energy Ion Irradiation
K Furuya, M Song, M Takeguchi
Published online by Cambridge University Press:

03 August 2008, pp. 1262-1263
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SiO2 Adlayers on Si with a Low Energy Enhancing X-ray Optic
E Lochner, G Brown, D OHara
Published online by Cambridge University Press:

03 August 2008, pp. 1264-1265
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A new approach for analysis of thin films on the nano-scale
PJ Statham, C Penman
Published online by Cambridge University Press:

03 August 2008, pp. 1266-1267
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Single particle analysis using microbeam X-rays
AG Attaelmanan
Published online by Cambridge University Press:

03 August 2008, pp. 1268-1269
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in Quantitative Elemental Analyses by Laser Ablation ICP-MS
AE Koenig
Published online by Cambridge University Press:

03 August 2008, pp. 1270-1271
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Improved Analytical Resolution and Sensitivity in EPMA - Some Initial Results from the Ultrachron Development Project
MJ Jercinovic, ML Williams, DR Snoeyenbos
Published online by Cambridge University Press:

03 August 2008, pp. 1272-1273
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Water by EPMA- New Developments
JJ Donovan, EP Vicenzi
Published online by Cambridge University Press:

03 August 2008, pp. 1274-1275
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Constructing ternary phase diagrams directly from EPMA compositional maps
DR Snoeyenbos, DA Wark, J-C Zhao
Published online by Cambridge University Press:

03 August 2008, pp. 1276-1277
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Combined EPMA and SHRIMP Analyses of Xenotime to Interpret the Geochronological Record
HA Lowers, JN Aleinikoff, FK Mazdab
Published online by Cambridge University Press:

03 August 2008, pp. 1278-1279
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparing the Effects of Different Gas Mixtures and Vacuum Chamber Geometries on the Evactron® Cleaning Process
CG Morgan, R Vane
Published online by Cambridge University Press:

03 August 2008, pp. 1280-1281
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 32 of 41

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 14 - Supplement S2 - August 2008

Atom-Probe Analysis of Non-traditional Materials

Research Article

LA-WATAP and SIMS as Complementary Techniques for Quantitative Measurement of Nnanometer Structures

A New Approach for the Mass Analysis of Biomolecules at Atomic Level Utilizing the Scanning Atom Probe

Site Specific Atom Probe Analysis from Ceramic, Geologic and Bio-Materials

Discovery of 250 Ma Cellulose Fibers in a Deep Permian Halite Layer Poses Unique Challenges in TEM Imaging and Analysis

Identification and Analysis of Fluorine Clustering in Boron Implants

Diffusion of TaN and HfO into TiN in a Metal Gate Stack

Analysis of Bulk Dielectrics with Atom Probe Tomography

New Analytical Techniques in Microbeam Analysis

Research Article

Celebrating EDS Technology - 30 Years of Turning Photons into Minerals

SLICE, A Database Approach to EDS

The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors

Anomalous X-ray Emission from Insulator Materials Associated with Low Energy Ion Irradiation

SiO2 Adlayers on Si with a Low Energy Enhancing X-ray Optic

A new approach for analysis of thin films on the nano-scale

Single particle analysis using microbeam X-rays

Advances in Quantitative Elemental Analyses by Laser Ablation ICP-MS

Improved Analytical Resolution and Sensitivity in EPMA - Some Initial Results from the Ultrachron Development Project

Water by EPMA- New Developments

Constructing ternary phase diagrams directly from EPMA compositional maps

Combined EPMA and SHRIMP Analyses of Xenotime to Interpret the Geochronological Record

Comparing the Effects of Different Gas Mixtures and Vacuum Chamber Geometries on the Evactron® Cleaning Process

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 14 - Supplement S2 - August 2008

Atom-Probe Analysis of Non-traditional Materials

Research Article

New Analytical Techniques in Microbeam Analysis

Research Article