Microscopy and Microanalysis: Volume 14 - Issue S2

< Back to all issues

Volume 14 - Supplement S2 - August 2008

Contents

Page 30 of 41

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope
R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1162-1163
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector
D Newbury, J Davis, D Bright, N Ritchie, J Michael, P Kotula
Published online by Cambridge University Press:

03 August 2008, pp. 1164-1165
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in the technology of silicon drift detectors (SDD) and multiple element SDD
R Terborg, M Rohde
Published online by Cambridge University Press:

03 August 2008, pp. 1166-1167
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance Comparison of SDDs with Si(Li)s for SEM/EDS Analysis
NC Barbi, ET Dobi, SD DaVilla, RM Mott
Published online by Cambridge University Press:

03 August 2008, pp. 1168-1169
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analyzing and Expanding the Detector Efficiency of Silicon Drift Detectors
A Niculae, H Soltau, P Lechner, G Lutz, A Bechteler, R Eckhardt, K Hermenau, A Liebel, O Jaritschin, A Simsek, G Schaller, F Schopper, L Strüder
Published online by Cambridge University Press:

03 August 2008, pp. 1170-1171
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis
EA Kenik
Published online by Cambridge University Press:

03 August 2008, pp. 1172-1173
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determination of the Efficiency of Energy Dispersive X-ray Spectrometers with an EDS-CRM Reference Specimen
H Demers, R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1174-1175
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra - Application to Difficult Overlaps
N Ritchie, JM Davis, DE Newbury
Published online by Cambridge University Press:

03 August 2008, pp. 1176-1177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sum Peaks in Energy-Dispersive X-ray Spectroscopy
A Eades
Published online by Cambridge University Press:

03 August 2008, pp. 1178-1179
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterizing EDS Coincidence Detection At High Rates For Low Energies
RB Mott
Published online by Cambridge University Press:

03 August 2008, pp. 1180-1181
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Rutile Rock: Ti-L, O-K peak deconvolution in the presence of Fe-K
P Camus, D Rohde, B Leite
Published online by Cambridge University Press:

03 August 2008, pp. 1182-1183
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Application of the Helium Ion Microscope for the Imaging and Analysis of Nanomaterials
DC Bell, LA Stern, L Farkas, JA Notte
Published online by Cambridge University Press:

03 August 2008, pp. 1184-1185
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images
S Wight, D Meier, M Postek, A Vladar, J Small, D Newbury
Published online by Cambridge University Press:

03 August 2008, pp. 1186-1187
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Relative Contrast in Ion and Electron Induced Secondary Electron Images
LA Giannuzzi, M Utlaut, M Scheinfein
Published online by Cambridge University Press:

03 August 2008, pp. 1188-1189
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope
BJ Griffin, D Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1190-1191
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Study of Helium ion induced Secondary Electron Emission
R Ramachandra, BJ Griffin, D Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1192-1193
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films
C Trager-Cowan, F Sweeney, PR Edwards, FL Dynowski, AJ Wilkinson, A Winkelmann, AP Day, T Wang, PJ Parbrook, IM Watson, DC Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1194-1195
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Beam Induced Processing: Experimentation, Simulation, and Applications
JD Fowlkes, DA Smith, PD Rack
Published online by Cambridge University Press:

03 August 2008, pp. 1196-1197
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Imaging in the SEM with X-Rays?
R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1198-1199
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In Situ Imaging of Hydrated Specimens at Room Temperature in ESEM
J Chen, WAJ Neijssen, DJ Stokes, M Uncovsky
Published online by Cambridge University Press:

03 August 2008, pp. 1200-1201
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 30 of 41

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 14 - Supplement S2 - August 2008

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope

Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector

Advances in the technology of silicon drift detectors (SDD) and multiple element SDD

Performance Comparison of SDDs with Si(Li)s for SEM/EDS Analysis

Analyzing and Expanding the Detector Efficiency of Silicon Drift Detectors

Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis

Determination of the Efficiency of Energy Dispersive X-ray Spectrometers with an EDS-CRM Reference Specimen

DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra - Application to Difficult Overlaps

Sum Peaks in Energy-Dispersive X-ray Spectroscopy

Characterizing EDS Coincidence Detection At High Rates For Low Energies

Rutile Rock: Ti-L, O-K peak deconvolution in the presence of Fe-K

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Application of the Helium Ion Microscope for the Imaging and Analysis of Nanomaterials

He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images

Relative Contrast in Ion and Electron Induced Secondary Electron Images

Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope

A Study of Helium ion induced Secondary Electron Emission

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films

Electron Beam Induced Processing: Experimentation, Simulation, and Applications

Imaging in the SEM with X-Rays?

In Situ Imaging of Hydrated Specimens at Room Temperature in ESEM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 14 - Supplement S2 - August 2008

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

21st Century Scanning Microscopy - Electrons and He Ions

Research Article