Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 35 of 41

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Plasmon Resonance Chemical Phase Mapping of Reactive Multilayers
MA Mat Yajid, T Wagner, G Möbus
Published online by Cambridge University Press:

03 August 2008, pp. 1362-1363
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods
W Walkosz, R Klie, S Öǧüt, A Borisevich, P Becher, SJ Pennycook, JC Idrobo
Published online by Cambridge University Press:

03 August 2008, pp. 1364-1365
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Magnetic Linear Dichroism Probed by High Momentum Resolution EELS
Y Ito, NJ Zaluzec, AN Chiaramonti, RE Cook, M Van Veenendaal, DJ Miller
Published online by Cambridge University Press:

03 August 2008, pp. 1366-1367
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Elemental Mapping of Nanoscale Structures in the Aberration-Corrected Analytical Electron Microscope
A Herzing, IM Anderson, JK Edwards, AF Carley, GJ Hutchings, X Li, W Zhang, CJ Kiely
Published online by Cambridge University Press:

03 August 2008, pp. 1368-1369
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
B Freitag, G Knippels, S Kujawa, M van der Stam, D Hubert, PC Tiemeijer, C Kisielowski, P Denes, A Minor, U Dahmen
Published online by Cambridge University Press:

03 August 2008, pp. 1370-1371
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM
E Okunishi, H Sawada, Y Kondo, M Kersker
Published online by Cambridge University Press:

03 August 2008, pp. 1372-1373
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
H Inada, Y Zhu, J Wall, V Volkov, K Nakamura, M Konno, K Jarausch, RD Twesten
Published online by Cambridge University Press:

03 August 2008, pp. 1374-1375
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance of a Nion Co. UltraSTEMTM
P Wang, M Gass, M Falke, A Bleloch
Published online by Cambridge University Press:

03 August 2008, pp. 1376-1377
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanoscale Elemental Analysis by EELS in the Life Sciences
RD Leapman
Published online by Cambridge University Press:

03 August 2008, pp. 1378-1379
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High Resolution Polymer Imaging Using Scanning Transmission Electron Microscopy
EI Garcia-Meitin, G Bar, J Blackson, D Reuschle
Published online by Cambridge University Press:

03 August 2008, pp. 1380-1381
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In Situ Measurements of Ni Oxidation Using Electron Energy-Loss Spectroscopy
P Rez, ES Moore, R Sharma
Published online by Cambridge University Press:

03 August 2008, pp. 1382-1383
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Elemental Mapping in Three Dimensions using 4D STEM-EELS Tomography
P Thomas, C Booth, R Harmon, S Markovic, RD Twesten, K Jarausch
Published online by Cambridge University Press:

03 August 2008, pp. 1384-1385
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage
H Inada, J Wall, Y Zhu, V Volkov, K Nakamura, M Konno, K Jarausch
Published online by Cambridge University Press:

03 August 2008, pp. 1386-1387
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques
Y Xin, LF Allard, ZQ Mao
Published online by Cambridge University Press:

03 August 2008, pp. 1388-1389
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Catalysts using Aberration-Corrected TEM
S Rozeveld, DA Blom, LF Allard, T Richardson, C Todd, JH Blackson
Published online by Cambridge University Press:

03 August 2008, pp. 1390-1391
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Influence of Au electrodes on the properties of SrTiO3/La0.67Sr0.33MnO3/Au magnetic tunnel junctions studied by bberration-corrected STEM-EELS
C Magen, M Varela, SJ Pennycook, S Brivio, D Petti, M Cantoni, R Bertacco
Published online by Cambridge University Press:

03 August 2008, pp. 1392-1393
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanoscale EELS and EDX Analyses of GaN Nanowires and GaN/AlGaN Radial Heterostructure Nanowires
L Lari, RT Murray, MH Gass, T Bullough, PR Chalker, C Chèze, L Geelhaar, H Riechert
Published online by Cambridge University Press:

03 August 2008, pp. 1394-1395
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Probing the Composition Variations in Nanoscale Multilayers
A Genç, R Banerjee, AWS Johnson, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 1396-1397
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Z-Contrast Imaging and EELS Study of Supported CoPd Nano-Catalyst
Y Zhao, L D’Souza, JR Regalbuto, RF Klie
Published online by Cambridge University Press:

03 August 2008, pp. 1398-1399
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope
M Watanabe, M Kanno, D Ackland, CJ Kiely, DB Williams
Published online by Cambridge University Press:

03 August 2008, pp. 1400-1401
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 35 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Plasmon Resonance Chemical Phase Mapping of Reactive Multilayers

Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods

Magnetic Linear Dichroism Probed by High Momentum Resolution EELS

Elemental Mapping of Nanoscale Structures in the Aberration-Corrected Analytical Electron Microscope

First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM

The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

Performance of a Nion Co. UltraSTEMTM

Nanoscale Elemental Analysis by EELS in the Life Sciences

High Resolution Polymer Imaging Using Scanning Transmission Electron Microscopy

In Situ Measurements of Ni Oxidation Using Electron Energy-Loss Spectroscopy

Elemental Mapping in Three Dimensions using 4D STEM-EELS Tomography

Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage

Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques

Analysis of Catalysts using Aberration-Corrected TEM

Influence of Au electrodes on the properties of SrTiO3/La0.67Sr0.33MnO3/Au magnetic tunnel junctions studied by bberration-corrected STEM-EELS

Nanoscale EELS and EDX Analyses of GaN Nanowires and GaN/AlGaN Radial Heterostructure Nanowires

Probing the Composition Variations in Nanoscale Multilayers

Z-Contrast Imaging and EELS Study of Supported CoPd Nano-Catalyst

Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article