Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 29 of 41

Problem Solving Using Microanalytical Techniques

Research Article

An Ex-Situ TEM Investigation into the Effect of Successive Reduction-Oxidation-Reduction Treatments on Closely Spaced Copper Metal Particles
CE Kliewer
Published online by Cambridge University Press:

03 August 2008, pp. 1122-1123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A DigitalMicrograph™ Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM
VDH Hou
Published online by Cambridge University Press:

03 August 2008, pp. 1124-1125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Method to Correct Elliptical Distortion of Diffraction Patterns in TEM
VDH Hou, D Li
Published online by Cambridge University Press:

03 August 2008, pp. 1126-1127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Distortion Minimization of CBED Patterns in TEM
VDH Hou
Published online by Cambridge University Press:

03 August 2008, pp. 1128-1129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Combined Raman Spectroscopy and SEM Analysis of CVD Grown Carbon Nanotubes
B Duong, Y Peng, M Ellis, S Seraphin, H Xin
Published online by Cambridge University Press:

03 August 2008, pp. 1130-1131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Effect of Zr/Ti Ratio on the Microstructure of PZT Film
YH Oh, BW Koo, JY Jo, TW Noh, S-H Kim, Y-W Kim
Published online by Cambridge University Press:

03 August 2008, pp. 1132-1133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparison of elemental distribution profiles across Cu(In, Ga)Se2 solar-cell absorbers acquired by various techniques
D Abou-Ras, CA Kaufmann, A Eicke, M Döbeli, B Gade, T Nunney
Published online by Cambridge University Press:

03 August 2008, pp. 1134-1135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The Quantitative Analysis of Super-Low Phosphorus Content of SUS316L Type Stainless Steel With EPMA Calibration Curve Method
T Kimura, S Iwasaki, K Sakuraya, S Tanuma
Published online by Cambridge University Press:

03 August 2008, pp. 1136-1137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Microscopy Study of Germanium Glass Vitrified by High Pressure Melt-Quench
VC Solomon, MH Bhat, V Molinero, E Soignard, S Sastry, JL Yarger, AC Angell
Published online by Cambridge University Press:

03 August 2008, pp. 1138-1139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advanced Large Active Area SDD for X-Ray Spectroscopy
VD Saveliev, CR Tull, L Feng, S Barkan, M Takahashi, EV Damron
Published online by Cambridge University Press:

03 August 2008, pp. 1140-1141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM and SEM Investigation on Oxidised Ge-based Clathrates
C Hébert, B Bartova, M Cantoni, U Aydemir, M Baitinger
Published online by Cambridge University Press:

03 August 2008, pp. 1142-1143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Computer-Controlled Polishing Preparation and Subsequent Mounting of Samples for Low-voltage X-Ray Tomography
P Prasad, D Erwin, JA Hunt
Published online by Cambridge University Press:

03 August 2008, pp. 1144-1145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analytical TEM of Nb3Sn Multifilament Superconductor Wires
M Cantoni, V Abächerli, D Uglietti, B Seeber, R Flükiger
Published online by Cambridge University Press:

03 August 2008, pp. 1146-1147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EMCD in the TEM – Optimization of signal acquisition and data evaluation
H Lidbaum, J Rusz, A Liebig, B Hjörvarsson, PM Oppeneer, E Coronel, O Eriksson, K Leifer
Published online by Cambridge University Press:

03 August 2008, pp. 1148-1149
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Research Article

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts
PK Carpenter
Published online by Cambridge University Press:

03 August 2008, pp. 1150-1151
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)
K Keil, R Fitzgerald, KFJ Heinrich
Published online by Cambridge University Press:

03 August 2008, pp. 1152-1153
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

35 Years of EDS Software: the more things change, the more they stay the same
F Schamber
Published online by Cambridge University Press:

03 August 2008, pp. 1154-1155
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SDDs - Silicon Detectors for EDS with a Performance at the Theoretical Limit
H Soltau, A Bechtele, O Jaratschin, A Liebl, A Niculae, A Simsek, R Eckhard, K Hermenau, P Lechner, G Lutz, G Schaller, F Schopper, L Strüder
Published online by Cambridge University Press:

03 August 2008, pp. 1156-1157
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Calibration of the detection efficiency of energy dispersive X-ray spectrometers for absolute intensity measurements and for establishing a basis for a more rigorous quantitation procedure
M Procop, F Scholze
Published online by Cambridge University Press:

03 August 2008, pp. 1158-1159
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A New Solid-State Detector and Counting System for Wavelength Dispersive Spectrometers
D Lesher, Y Diawara, S Medved, R Durst
Published online by Cambridge University Press:

03 August 2008, pp. 1160-1161
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 29 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article

An Ex-Situ TEM Investigation into the Effect of Successive Reduction-Oxidation-Reduction Treatments on Closely Spaced Copper Metal Particles

A DigitalMicrograph™ Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM

A Method to Correct Elliptical Distortion of Diffraction Patterns in TEM

Distortion Minimization of CBED Patterns in TEM

Combined Raman Spectroscopy and SEM Analysis of CVD Grown Carbon Nanotubes

Effect of Zr/Ti Ratio on the Microstructure of PZT Film

Comparison of elemental distribution profiles across Cu(In, Ga)Se2 solar-cell absorbers acquired by various techniques

The Quantitative Analysis of Super-Low Phosphorus Content of SUS316L Type Stainless Steel With EPMA Calibration Curve Method

Electron Microscopy Study of Germanium Glass Vitrified by High Pressure Melt-Quench

Advanced Large Active Area SDD for X-Ray Spectroscopy

TEM and SEM Investigation on Oxidised Ge-based Clathrates

Computer-Controlled Polishing Preparation and Subsequent Mounting of Samples for Low-voltage X-Ray Tomography

Analytical TEM of Nb3Sn Multifilament Superconductor Wires

EMCD in the TEM – Optimization of signal acquisition and data evaluation

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Research Article

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)

35 Years of EDS Software: the more things change, the more they stay the same

SDDs - Silicon Detectors for EDS with a Performance at the Theoretical Limit

Calibration of the detection efficiency of energy dispersive X-ray spectrometers for absolute intensity measurements and for establishing a basis for a more rigorous quantitation procedure

A New Solid-State Detector and Counting System for Wavelength Dispersive Spectrometers

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 14 - Supplement S2 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Research Article

40 Years of Energy Dispersive X-ray Spectrometry

Research Article