Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 31 of 41

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Determination of the Estimated Resolution of SEM Images
C Probst, H Demers, R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1202-1203
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microscopic Characterization of Agave Tequilana Weber var. Azul Fibers from Agroindustrial Waste in Activated Carbon Production
L Ballinas, L Manjarrez, V Fierro, A Celzard, A Gonçalves, G Moraes-Rocha, G González-Sánchez
Published online by Cambridge University Press:

03 August 2008, pp. 1204-1205
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of Microscopic Structure of Cellulose and Lignin Based Membranes
L Ballinas, L Manjarrez, MA Hermosillo, R Valdez, A Gonçalves, G Moraes-Rocha, G González-Sánchez
Published online by Cambridge University Press:

03 August 2008, pp. 1206-1207
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Beam skirting effects on energy deposition profile in VP-SEM
BD Myers, Z Pan, VP Dravid
Published online by Cambridge University Press:

03 August 2008, pp. 1208-1209
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope
J Blackson, CS Todd, G Bar, D Reuschle, M Janus, M Darus, A Nickles
Published online by Cambridge University Press:

03 August 2008, pp. 1210-1211
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Comparison of Backscatter Electron, R-filter, and Scanning Transmission Imaging of Sectioned Resin Embedded Biological Materials in Field Emission Scanning Electron Microscope
N Erdman, CH Nielsen, CA Ackerley
Published online by Cambridge University Press:

03 August 2008, pp. 1212-1213
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Design and Development of an Ultra-High Vacuum Variable-Pressure Scanning Electron Microscope for Dynamical Studies of Nanostructures
M Klein, S Kodambaka, P Marienhoff
Published online by Cambridge University Press:

03 August 2008, pp. 1214-1215
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Interactions and Phase Transformations During the Synthesis of Ni Nanoparticles on a Mica Support
S Chenna, PA Crozier
Published online by Cambridge University Press:

03 August 2008, pp. 1216-1217
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in Low and Ultra-Low Energy, High-Resolution SEM
L Roussel, DJ Stokes, RJ Young, I Gestmann
Published online by Cambridge University Press:

03 August 2008, pp. 1218-1219
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Study of low or ultra-low voltage SEM imaging for mesoporous materials
S Takeuchi, A Miyaki, H Ito, T Sawahata, M Nakagawa, S Kataoka, Y Inagi, A Endo
Published online by Cambridge University Press:

03 August 2008, pp. 1220-1221
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Production and Measurement of Sputtered Iridium
P Savage, J Mansfield
Published online by Cambridge University Press:

03 August 2008, pp. 1222-1223
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Recent Applications Development with the Helium Ion Microscope
L Scipioni
Published online by Cambridge University Press:

03 August 2008, pp. 1224-1225
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Strain and its Contrast mechanisms in crystalline materials imaged with FE-SEM
H Jaksch
Published online by Cambridge University Press:

03 August 2008, pp. 1226-1227
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atom-Probe Analysis of Non-traditional Materials

Research Article

Microfabricated Field Emitter Arrays for Electron and Ion Emission
CA Spindt
Published online by Cambridge University Press:

03 August 2008, pp. 1228-1229
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography
RM Ulfig, TJ Prosa, DA Reinhard, E Oltman, RA Alvis
Published online by Cambridge University Press:

03 August 2008, pp. 1230-1231
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

3D Atom Probe and SIMS as complementary techniques for the observation and quantitative measurement of microstructures
L Renaud, I Martin, F Hillion, F Horreard, YS Yang, JS Kang, CG Park
Published online by Cambridge University Press:

03 August 2008, pp. 1232-1233
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Imaging Atom-Probe Studies of a Field Evaporation Based Deuterium Ion Source for Neutron Generators
PR Schwoebel, B Reichenbach, I Solano
Published online by Cambridge University Press:

03 August 2008, pp. 1234-1235
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Observations of Cluster Ions Originating from Non-Traditional Atom Probe Materials
TJ Prosa, RA Alvis, TF Kelly
Published online by Cambridge University Press:

03 August 2008, pp. 1236-1237
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Investigation of Performance-Influencing Factors in Pulsed Laser Atom Probe
JH Bunton, JD Olson, DR Lenz, TF Kelly
Published online by Cambridge University Press:

03 August 2008, pp. 1238-1239
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of Precipitation Behavior in a Spray-Formed Al-Zn-Mg Alloy Using a Combination of Transmission Electron Microscopy and Three Dimensional Atom Probe Tomography
J Hwang, R Banerjee, M Kaufman
Published online by Cambridge University Press:

03 August 2008, pp. 1240-1241
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 31 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Determination of the Estimated Resolution of SEM Images

Microscopic Characterization of Agave Tequilana Weber var. Azul Fibers from Agroindustrial Waste in Activated Carbon Production

Study of Microscopic Structure of Cellulose and Lignin Based Membranes

Beam skirting effects on energy deposition profile in VP-SEM

Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope

A Comparison of Backscatter Electron, R-filter, and Scanning Transmission Imaging of Sectioned Resin Embedded Biological Materials in Field Emission Scanning Electron Microscope

Design and Development of an Ultra-High Vacuum Variable-Pressure Scanning Electron Microscope for Dynamical Studies of Nanostructures

Surface Interactions and Phase Transformations During the Synthesis of Ni Nanoparticles on a Mica Support

Advances in Low and Ultra-Low Energy, High-Resolution SEM

A Study of low or ultra-low voltage SEM imaging for mesoporous materials

Production and Measurement of Sputtered Iridium

Recent Applications Development with the Helium Ion Microscope

Strain and its Contrast mechanisms in crystalline materials imaged with FE-SEM

Atom-Probe Analysis of Non-traditional Materials

Research Article

Microfabricated Field Emitter Arrays for Electron and Ion Emission

Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography

3D Atom Probe and SIMS as complementary techniques for the observation and quantitative measurement of microstructures

Imaging Atom-Probe Studies of a Field Evaporation Based Deuterium Ion Source for Neutron Generators

Observations of Cluster Ions Originating from Non-Traditional Atom Probe Materials

Investigation of Performance-Influencing Factors in Pulsed Laser Atom Probe

Characterization of Precipitation Behavior in a Spray-Formed Al-Zn-Mg Alloy Using a Combination of Transmission Electron Microscopy and Three Dimensional Atom Probe Tomography

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Atom-Probe Analysis of Non-traditional Materials

Research Article