Microscopy and Microanalysis: Volume 9 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

Challenges of Atomic Resolution for Materials Science – Progress by Aberration Correction

Single Molecule Force Spectroscopy by AFM-Related Techniques

EM: Still a versatile and obligatory tool for cell biologists

In The Quest of Order: The Role of Pattern Recognition in Microscopy Image Analysis

Scanning Probe Microscopies – Recent Developments and Applications

Analytical Electron Microscopy in Materials and Biological Sciences

Electron Holography

Membrane protein structure and function by electron cryo-microscopy

New Multichannel Electron Energy Analyzer with Cylindrically Symmetrical Electrostatic Field

Experimental Setup and Verification of the MANDOLINE Filter

Calculations of Intensive Electron Source for Electron Beam Welding

Deutsche Gesellschaft für Elektronenmikroskopie e.V.

Electrostatic Aberration Correction in Low-Voltage SEM

Preface

Calculation of Aberration Coefficients by Ray Tracing

Proposal of a Novel Highly Symmetric Wien Filter Monochromator

Improved Optical System For Low Energy Focused Ion Beam Column

Outline of an Ultracorrector Compensating for all Primary Chromatic and Geometrical Aberrations of Charged-Particle Lenses

Chromatic and Spherical Aberration Correction Using Time-Dependent Acceleration and Lens Fields

Fast Monte Carlo Simulations of Electron Electron Interactions in Microprobes

Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers