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Model-based Iterative Reconstruction for Low-dose Electron Tomography

Published online by Cambridge University Press:  27 August 2014

Singanallur V. Venkatakrishnan ,
Ming-Siao Hsiao ,
Nick Garvin ,
Michael A. Jackson ,
Marc De Graef ,
Jeff Simmons ,
Charles A. Bouman  and
Lawrence F. Drummy
Singanallur V. Venkatakrishnan
Affiliation:
School of Electrical and Computer Engineering, Purdue University, IN, 47906
Ming-Siao Hsiao
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433
Nick Garvin
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433
Michael A. Jackson
Affiliation:
BlueQuartz Software, LLC, Springboro, OH, 45066
Marc De Graef
Affiliation:
Department of Material Science and Engineering, Carnegie Mellon University, PA, 15213
Jeff Simmons
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433
Charles A. Bouman
Affiliation:
School of Electrical and Computer Engineering, Purdue University, IN, 47906
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 802 - 803
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Owen, G. R. Stokes, D. L. Modern Research and Educational Topics in Microscopy, A. Mendez-Vilas, J. Diaz (Eds.), Formatex 2007, p. 939-940Google Scholar
[2] Venkatakrishnan, S et al IEEE Trans. on Image Processing, vol. 22 (2013), no. 11, p. 4532-4544Google Scholar
[3] Yamada, Y. et al Investigative Radiology, vol. 47 (2012), no. 8, p. 482–489 Google Scholar
[4] Venkatakrishnan, S et al Proc. of SPIE 8657, Computational Imaging XI, 86570A 2013 Google Scholar
[5] www.OpenMBIR.org Google Scholar
[6] The authors would like to acknowledge support from the Air-Force Research Laboratory, UES Inc., and the Air-Force Office of Scientific ResearchGoogle Scholar