Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-05T08:47:42.593Z Has data issue: false hasContentIssue false
  • English
  • Français

Zone axis STEM defect imaging based on electron Kossel patterns

Published online by Cambridge University Press:  23 November 2012

P. Phillips ,
J. Kwon ,
M. Brandes ,
M. Mills  and
M. De Graef
P. Phillips
Affiliation:
University of Illinois at Chicago, Chicago, IL
J. Kwon
Affiliation:
Ohio State University, Columbus, OH
M. Brandes
Affiliation:
Ohio State University, Columbus, OH
M. Mills
Affiliation:
Ohio State University, Columbus, OH
M. De Graef
Affiliation:
Carnegie Mellon University, Pittsburgh, PA
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 710 - 711
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)