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Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

Published online by Cambridge University Press:  23 November 2012

J.R. Seal
Affiliation:
Michigan State University, East Lansing, MI
T. Bieler
Affiliation:
Michigan State University, East Lansing, MI
M. Crimp
Affiliation:
Michigan State University, East Lansing, MI
B. Britton
Affiliation:
University of Oxford, Oxford, United Kingdom
A. Wilkinson
Affiliation:
University of Oxford, Oxford, United Kingdom
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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