Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 17 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 17 - Supplement S2 - July 2011

Contents

Page 37 of 49

Physical Sciences

Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries

Abstract

  • Orientation Dependent Field Evaporation Behavior in Multilayer Thin Films

  • J Brons, A Herzing, I Anderson, G Thompson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1442-1443
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Effect of Film Morphology and Interface Structure on the Magnetic Properties of Fe-MgO Thin Films

  • S Spurgeon, S Lofland, A Misra, J Baldwin, M Taheri
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1444-1445
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Structural Characterization of Pt-Bi Thin Films Deposited by Electron Beam Evaporation

  • X Li, P Kharel, V Shah, D Sellmyer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1446-1447
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Study of Thin-Film Ferroelectric Heterostructures by TEM and PFM

  • J Jokisaari, C Nelson, S Kim, P Gao, S Baek, C Eom, X Pan
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1448-1449
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Probing Stoichiometry in LaAlO3/SrTiO3 Interfaces by Aberration-Corrected STEM

  • J Mundy, L Fitting Kourkoutis, M Warusawithana, D Schlom, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1450-1451
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Low Dose High-Resolution Electron Microscopy (HREM) of Poly(3,4-ethylene dioxythiophene) (PEDOT) Films

  • J Wu, D Martin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1452-1453
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • TEM Study of Oxide Nanopillars in Superconducting BaFe2As2 Films for Vortex Pinning

  • Y Zhang, C Nelson, S Lee, J Jiang, E Hellstrom, D Larbalestier, C Eom, X Pan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1454-1455
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A Thermodynamic Approach to Predict Dopant Atoms Segregation on Nanocrystals

  • D Stroppa, L Montoro, A Campello, A Beltrán, J Andrés, E Leite, A Ramirez
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1458-1459
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • TEM Simulations of Tilted Atomically Thin Hexagonal Boron Nitride Sheets

  • M Odlyzko, K Mkhoyan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1460-1461
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data

  • V Smentkowski, M Keenan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1462-1463
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Beam Heating of Water Droplets During in-situ ESEM Imaging of Condensation on Superhydrophobic Surfaces

  • K Rykaczewski, J Scott, A Fedorov
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1464-1465
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • EELS Investigation of the Formulas for Inelastic Mean Free Path

  • H Zhang, R Egerton, M Malac
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1466-1467
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Transmission Electron Microscopy Analysis of Defects in Boron Carbide Nanowires

  • T Gutu, Z Guan, T Xu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1468-1469
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Flame Retardant Carbon Nanofiber and Carbon Nanotube Coatings

  • A Cain, E Ellis, J Grunlan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1470-1471
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantifying Dispersion in Polymer Systems by Combining Image Analysis and Statistical Analysis

  • O Guise, C Strom
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1472-1473
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Beam Induced Radiation Damage in Nafion and the Lifetime of Fuel Cells

  • Q He, D Joy, D Keffer
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1474-1475
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microanalysis of Cement and Concrete Materials: State of the Art, Methodologies and Standarization

Abstract

  • Nanoscale Building Material Characterization by Means of High-Resolution SEM Imaging Techniques

  • B Möser
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1478-1479
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Three Dimensional Chemical Mapping of Fly Ash

  • Q Hu, R Frazier, T Ley, J Hanan, J Davis
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1480-1481
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 37 of 49