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Line Defects at Interfaces in Telluride-Based Thermoelectric Materials

Published online by Cambridge University Press:  08 April 2017

D Medlin ,
J Sugar ,
N Heinz ,
T Ikeda  and
G Snyder
D Medlin
Affiliation:
Sandia National Laboratories
J Sugar
Affiliation:
Sandia National Laboratories
N Heinz
Affiliation:
California Institute of Technology
T Ikeda
Affiliation:
California Institute of Technology
G Snyder
Affiliation:
California Institute of Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1344 - 1345
Copyright
Copyright © Microscopy Society of America 2011