Realization of the First Aplanatic Transmission Electron Microscope

I Maβmann; S Uhlemann; H Müller; P Hartel; J Zach; M Haider; Y Taniguchi; D Hoyle; R Herring

doi:10.1017/S1431927611007227

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Herring, Rodney A. 2013. Coherence of k-space electrons: application to TDS electrons by DBI. Microscopy, Vol. 62, Issue. suppl 1, p. S99.

Akashi, Tetsuya Takahashi, Yoshio Tanigaki, Toshiaki Shimakura, Tomokazu Kawasaki, Takeshi Furutsu, Tadao Shinada, Hiroyuki Müller, Heiko Haider, Maximilian Osakabe, Nobuyuki and Tonomura, Akira 2015. Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution. Applied Physics Letters, Vol. 106, Issue. 7,

Sawada, H. Sasaki, T. Hosokawa, F. and Suenaga, K. 2015. Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle. Physical Review Letters, Vol. 114, Issue. 16,

Zhang, Xiao Feng 2016. Enabling Lab-in-Gap Transmission Electron Microscopy at Atomic Resolution. Microscopy Today, Vol. 24, Issue. 1, p. 24.

Tanigaki, T. Akashi, T. Takahashi, Y. Kawasaki, T. and Shinada, H. 2016. Vol. 198, Issue. , p. 69.

CrossRef

Sawada, Hidetaka Ramlau, Reiner Allen, Christopher S. and Kirkland, Angus I. 2017. Characterization of thin film displacements in the electron microscope. Applied Physics Letters, Vol. 111, Issue. 20,

Sawada, Hidetaka and Kirkland, Angus I. 2017. Measurement of Off-Axial Aberration. Journal of Physics: Conference Series, Vol. 902, Issue. , p. 012011.

Hartel, P. Gerheim, V. Linck, M. Müller, H. Uhlemann, S. Zach, Z. and Haider, M. 2019. On the residual six-fold astigmatism in DCOR/ASCOR. Ultramicroscopy, Vol. 206, Issue. , p. 112821.

Houdellier, Florent 2023. Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources. Vol. 227, Issue. , p. 1.

2023. Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources. Vol. 227, Issue. , p. 217.

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Realization of the First Aplanatic Transmission Electron Microscope

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