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CCEREM: Critical-Convergence Extended-Resolution Electron Microscopy

Published online by Cambridge University Press:  08 April 2017

M O'Keefe ,
L Allard  and
D Blom
M O'Keefe
Affiliation:
OKCS
L Allard
Affiliation:
Oak Ridge National Laboratory
D Blom
Affiliation:
University of South Carolina

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1264 - 1265
Copyright
Copyright © Microscopy Society of America 2011