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Quantification of Phase Compositions and Diffusional Profiles in Simulated Solid-State Welds of Ti-17 via Super-X Energy-Dispersive X-Ray Spectroscopy

Published online by Cambridge University Press:  23 September 2015

Jonathan Orsborn ,
Robert E.A. Williams  and
Hamish Fraser
Jonathan Orsborn
Affiliation:
Center for the Accelerated Maturation of Materials, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A. Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, U.S.A.
Robert E.A. Williams
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, U.S.A.
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1089 - 1090
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Lutjering G., G. & Williams, J.C. in Titanium. Springer, Berlin.Google Scholar
[2] Williams, R.E.A., Ph.D. Dissertation (2010.Google Scholar
[3] Cliff, G. & Lorimer, G. W., Journal of Microscopy 103 (1975). p. 203–207.CrossRefGoogle Scholar
[4] Support for this work, from Tom Broderick at GE Aviation, is greatly appreciated..Google Scholar