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Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors
Published online by Cambridge University Press: 23 September 2015
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- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1091 - 1092
- Copyright
- Copyright © Microscopy Society of America 2015
References
References:
[1]
Schlossmacher, P., etal, Microscopy and Analysis (nanotechnology supplement)
24 (2010). p. 55.Google Scholar
[6]
Williams, D.B. & Goldstein, J.I. in Analytical Electron Microscopy 1981 (ed. R.H. Geiss, San Francisco Press, San Francisco, p. 39.Google Scholar
[7] This work is supported by the Air Force Office of Scientific Research (Grant: FA9550-14-1-0182). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation..Google Scholar