Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Modifications to Membrane Heater Holders to Enable XEDS in the AEM

Annular Bright-Field Electron Microscopy Tracking Solid-State Chemical Reaction

Ex Situ and In Situ (S)TEM of Iron Oxide Nanoparticles Synthesized by Decomposition of an Organometallic Precursor

Diffraction-Ring Contraction as a Method of In Situ Thermometry in TEM

Studying Perovskite-based Solar Cells with Correlative In-Situ Microscopy

Quantitative Analysis of Nucleation and Growth Behavior from in situ Liquid Cell Studies

Liquid Cell TEM of Al Thin Film Corrosion under Potentiostatic Polarization

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

Abstract

Structural Analysis of Carbon Nanotubes of Various Diameters Grown by Spray Pyrolysis using Raman Spectroscopy

Cu/MWCNT Interfaces in Room Temperature Aged Nanocomposites Revealed by HRTEM and EELS

Graphene Related Nanostructures Synthesized by High-Energy Ball Milling

Electron Microscopy and Photocatalytic Studies of 1D TiO2 Nanostructures Synthesized by Two Different Routes

Strain Relaxation in InAs Quantum Dots and its Suppression by Indium Flushing

Peculiar Plasmon Peak Position in Electron Energy Loss Spectrum of Hexagonal Boron Nitride/Graphene Double Layer

Nanostructured Ruthenium Disulfide Catalyst High Active in the HDS of DBT

Template Synthesis of Hollow Carbon Nanofibers

Atomic Resolution Study of W-Doped VO2 Nanowires

Influence of Nonlinear Intensity Attenuation in Bright-Field TEM Images on Tomographic Reconstructions of Micron-Scaled Materials

Atomic-Scale Characterization of the Reduction of a-Fe2O3 Nanowires

Atomic Structure of Amorphous 2D Carbon Structures as Revealed by Scanning Transmission Electron Microscopy

P05 Nuclear and Irradiated Materials: Fundamental Defect Properties

Abstract

Sample preparation artifacts in nuclear materials and mitigation strategies

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

Abstract

P05 Nuclear and Irradiated Materials: Fundamental Defect Properties

Abstract