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Annular Bright-Field Electron Microscopy Tracking Solid-State Chemical Reaction

Published online by Cambridge University Press:  23 September 2015

Peng Gao ,
Ryo Ishikawa ,
Eita Tochigi ,
Akihito Kumamoto ,
Naoya Shibata  and
Yuichi Ikuhara
Peng Gao
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Eita Tochigi
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Akihito Kumamoto
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 963 - 964
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Gao, P., et al, Nature Communications 4 (2013) 2791.Google Scholar
[2] Ishikawa, R., et al, Physical Review Letters 113 (2014) 155501.CrossRefGoogle Scholar
[3] Findlay, S., et al, Applied Physics Express 3 (2010) 116603.CrossRefGoogle Scholar
[4] The authors gratefully acknowledge the financial support through a Grant-in-Aid for Scientific Research on Innovative Areas "Nano Informatics" (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS), and "Nanotechnology Platform" (Project No. 12024046) from the Ministry of Education, Culture, Sports, Science and Technology in Japan (MEXT)..Google Scholar