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Diffraction-Ring Contraction as a Method of In Situ Thermometry in TEM

Published online by Cambridge University Press:  23 September 2015

Daniel R. Cremons  and
David J. Flannigan
Daniel R. Cremons
Affiliation:
department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, 55455, USA
David J. Flannigan
Affiliation:
department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, 55455, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 967 - 968
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Brons, J. G. & Thompson, G. B., Thin Solid Films 558 (2014) 170–175.Google Scholar
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[7] The authors acknowledge support from 3M in the form of a Nontenured Faculty Award (Grant #13673369), Seagate, and from the Donors of the American Chemical Society Petroleum Research Fund in the form of a Doctoral New Investigator Grant PRF#53116-DNI7. Thin film deposition was carried out in the Minnesota Nano Center, University of Minnesota. Parts of this work were carried out in the Characterization Facility, University of Minnesota, which receives partial support from the NSF through the MRSEC program..Google Scholar