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Volume 16 supplement s2

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Volume 16 - Supplement S2 - July 2010

Contents

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Physical Sciences Symposia

Probing the Properties of Nanomaterials with Microscopy

Abstract

Chemical Mapping of Block Copolymer Electrolytes by EFTEM Spectrum Imaging
FI Allen, M Watanabe, NP Balsara, AM Minor
Published online by Cambridge University Press:

01 August 2010, pp. 1762-1763
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Measurement of Volumes for Nanoparticles by High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy
B Yuan, H Heinrich, B Yao, A Dutta
Published online by Cambridge University Press:

01 August 2010, pp. 1764-1765
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Plasmon Driven Nanoparticle Movement in the Electron Beam
A Reyes-Coronado, J Aizpurua, PM Echenique, RG Barrera, PE Batson
Published online by Cambridge University Press:

01 August 2010, pp. 1766-1767
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

DNA Sequencing with TEM
DC Bell, W Thomas, K Murtagh, WR Glover
Published online by Cambridge University Press:

01 August 2010, pp. 1768-1769
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The SEM/FIB Workbench: Nanorobotics System Inside of Scanning Electron or Focused Ion Beam Microscopes
V Klocke, B Plitzko
Published online by Cambridge University Press:

01 August 2010, pp. 1770-1771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Structural Studies of Mono-Atomic Layer-Deposited (FePt)1-xCux Thin Films and FePt Thin Films with Pt Top-Layer Deposition
XZ Li, YS Yu, T George, DJ Sellmyer
Published online by Cambridge University Press:

01 August 2010, pp. 1772-1773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Structural Characterization of Gold Icosahedron Crystals
SV Prikhodko, M Pozuelo, L Chen, SD Sitzman, R Richards, S Kodambaka
Published online by Cambridge University Press:

01 August 2010, pp. 1774-1775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Self-Assembled Lanthanide Phosphate/Magnetite Nanocomposites
J Fang, M Saunders, Y Guo, G Lu, CL Raston, KS Iyer
Published online by Cambridge University Press:

01 August 2010, pp. 1776-1777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Probing the Mechanical Properties of Metal Wires at Small Scale by Microscopy
T Scherer, S Zhong, D Wang
Published online by Cambridge University Press:

01 August 2010, pp. 1778-1779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Swift Heavy Ion Irradiation of Nickel Nanoparticles
DJ Sprouster, R Giulian, DJ Llewellyn, P Kluth, LL Araujo, JD Fitzgerald, MC Ridgway
Published online by Cambridge University Press:

01 August 2010, pp. 1780-1781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Absolute Strain at the Nanoscale from HREM Images
CL Johnson, E Snoeck, MJ Hÿtch
Published online by Cambridge University Press:

01 August 2010, pp. 1782-1783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Piezoelectric Goniometer Inside a TEM Goniometer
W Guan, A Lockwood, BJ Inkson, G Möbus
Published online by Cambridge University Press:

01 August 2010, pp. 1784-1785
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Strain Relaxation in Planar InAs Epitaxial Layers Studied by High-Resolution Transmission Electron Microscopy
K Mahalingam, KG Eyink, M Twyman, J Shoaf, L Grazulis
Published online by Cambridge University Press:

01 August 2010, pp. 1786-1787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Crystalline Structure and ELNES of Branched Al2O3 Nanowires
M Eastman, R Schaller, A Besser, J Jiao
Published online by Cambridge University Press:

01 August 2010, pp. 1788-1789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

TEM and EBSD Study of Fe3O4 Particle Chains Grown and Assembled in External Magnetic Field
J-G Zheng, Y Zhang, Y Zhai, HW Yang
Published online by Cambridge University Press:

01 August 2010, pp. 1790-1791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Methods for TEM Analysis of NIST’s SWCNT SRM
RH Geiss, E Mansfield, JA Fagan
Published online by Cambridge University Press:

01 August 2010, pp. 1792-1793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Electron Irradiation Damage of MgO Nanocube
H Zhang, M Malac, RF Egerton
Published online by Cambridge University Press:

01 August 2010, pp. 1794-1795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Conjugated Polymer Nanoparticles for Fluorescent Labeling of Live Cells and Delivery of Biological Molecules into Plant Cells
AT Silva, JH Moon, J Verchot-Lubicz
Published online by Cambridge University Press:

01 August 2010, pp. 1796-1797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The Importance of High-Resolution Scanning Transmission Electron Microscopy For Fine-Scale Dislocation Analysis
PJ Phillips, L Kovarik, RR Unocic, D Wei, D Mourer, MJ Mills
Published online by Cambridge University Press:

01 August 2010, pp. 1798-1799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

In Situ Electrical Characterization of Single Nanofibers Using a Nanomanipulator in an FIB/SEM Microscope
K Roelofs, S Xu, G Poirier, N Yao
Published online by Cambridge University Press:

01 August 2010, pp. 1800-1801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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