Microscopy and Microanalysis: Volume 16 - Issue S2

3D Elemental Mapping in Nanomaterials by Core-Loss EFTEM Tomography
NY Jin-Phillipp, CT Koch, PA van Aken
Published online by Cambridge University Press:

01 August 2010, pp. 1842-1843
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Three-Dimensional Evaluation of a Multi-Walled Carbon Nanotube Probe by Using High-Resolution Transmission Electron Microscope
T Tanigaki, Y Nagakubo, K Hidaka
Published online by Cambridge University Press:

01 August 2010, pp. 1844-1845
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Computational Approach of High Efficiency CT (HECT)TM in TEM/STEM
W Jarisch
Published online by Cambridge University Press:

01 August 2010, pp. 1846-1847
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Analysis of Materials Structures Based on 3D Image Data
K Schladitz, M Godehardt, C Kübel
Published online by Cambridge University Press:

01 August 2010, pp. 1848-1849
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Analysis of Electron Tomograms Using Auto- and Cross-Correlations
H Friedrich, C Gommes, P de Jongh, K de Jong
Published online by Cambridge University Press:

01 August 2010, pp. 1850-1851
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Statistical Methods for Image Segmentation and Tomography Reconstruction
M Comer, C Bouman, J Simmons
Published online by Cambridge University Press:

01 August 2010, pp. 1852-1853
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Template Matching as a Tool to Analyze Electron Tomograms
R Schoenmakers, A Yakushevska, M Storms
Published online by Cambridge University Press:

01 August 2010, pp. 1854-1855
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The Atom TOMography (ATOM) Concept
MK Miller, TF Kelly
Published online by Cambridge University Press:

01 August 2010, pp. 1856-1857
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Applying Multivariate Statistical Analysis to Atom Probe Tomography
C Parish, C Capdevila, MK Miller
Published online by Cambridge University Press:

01 August 2010, pp. 1858-1859
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods
M Greene, TJ Prosa, DJ Larson, TF Kelly
Published online by Cambridge University Press:

01 August 2010, pp. 1860-1861
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)
B McMorran, D Pierce, J Unguris
Published online by Cambridge University Press:

01 August 2010, pp. 1862-1863
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Serial Block Face Imaging of Aluminium
J Mancuso, T Hashimoto, G Thompson
Published online by Cambridge University Press:

01 August 2010, pp. 1864-1865
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Angular Butterfly Fourier Filter for Suppression of Ray Artifacts in Tomographic Reconstructions
L Kovacik
Published online by Cambridge University Press:

01 August 2010, pp. 1866-1867
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Limits of Tomographic Reconstruction of Discrete Nanoparticles
X Wang, M Malac, A Meldrum, R Lockwood, P Li, H Furukawa
Published online by Cambridge University Press:

01 August 2010, pp. 1868-1869
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High-Throughput 3D Visualization of Large Volumes at High Resolution by 3ViewTM
A Dohnalkova, D Kennedy, J Mancuso, M Marshall, P Mainwaring, J Fredrickson
Published online by Cambridge University Press:

01 August 2010, pp. 1870-1871
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Xray Tomographic Microscopic Studies a Resin Embedded Paint Sample from a Mechanical Failing Area in the Floor Tiles of The Art of Painting by Johannes Vermeer (1632-1675)
J Boon, E Oberthaler, E Ferreira, F Marone, M Stampanoni
Published online by Cambridge University Press:

01 August 2010, pp. 1872-1873
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Electron Tomography of Size-Controlled Metallic Nanodots on Sintered Titania Photocatalysts
K Yoshida, PL Gai, S Sueda, N Tanaka
Published online by Cambridge University Press:

01 August 2010, pp. 1874-1875
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires
J Wu, S Xie, E Hemesath, L Lauhon, VP Dravid
Published online by Cambridge University Press:

01 August 2010, pp. 1876-1877
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Combining Time-Resolved Deformation Experiments with Electron Tomography to Understand Dislocation-Particle Interactions
G Liu, IM Robertson
Published online by Cambridge University Press:

01 August 2010, pp. 1878-1879
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Utilizing Diffraction-Contrast Tomographic Reconstructions to Understand Hydride Volume Expansion Accommodation Processes in Zr Alloy
C Smith, IM Robertson
Published online by Cambridge University Press:

01 August 2010, pp. 1880-1881
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 16 - Supplement S2 - July 2010

Physical Sciences Symposia

3DEM: Quantitative Analysis at the Nano and Microscale using Tomographic Techniques

Abstract

3D Elemental Mapping in Nanomaterials by Core-Loss EFTEM Tomography

Three-Dimensional Evaluation of a Multi-Walled Carbon Nanotube Probe by Using High-Resolution Transmission Electron Microscope

Computational Approach of High Efficiency CT (HECT)TM in TEM/STEM

Quantitative Analysis of Materials Structures Based on 3D Image Data

Quantitative Analysis of Electron Tomograms Using Auto- and Cross-Correlations

Statistical Methods for Image Segmentation and Tomography Reconstruction

Template Matching as a Tool to Analyze Electron Tomograms

The Atom TOMography (ATOM) Concept

Applying Multivariate Statistical Analysis to Atom Probe Tomography

Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods

Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

Serial Block Face Imaging of Aluminium

Angular Butterfly Fourier Filter for Suppression of Ray Artifacts in Tomographic Reconstructions

Limits of Tomographic Reconstruction of Discrete Nanoparticles

High-Throughput 3D Visualization of Large Volumes at High Resolution by 3ViewTM

Xray Tomographic Microscopic Studies a Resin Embedded Paint Sample from a Mechanical Failing Area in the Floor Tiles of The Art of Painting by Johannes Vermeer (1632-1675)

Quantitative Electron Tomography of Size-Controlled Metallic Nanodots on Sintered Titania Photocatalysts

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

Combining Time-Resolved Deformation Experiments with Electron Tomography to Understand Dislocation-Particle Interactions

Utilizing Diffraction-Contrast Tomographic Reconstructions to Understand Hydride Volume Expansion Accommodation Processes in Zr Alloy

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 16 - Supplement S2 - July 2010

Physical Sciences Symposia

3DEM: Quantitative Analysis at the Nano and Microscale using Tomographic Techniques

Abstract