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The Importance of High-Resolution Scanning Transmission Electron Microscopy For Fine-Scale Dislocation Analysis

Published online by Cambridge University Press:  01 August 2010

PJ Phillips ,
L Kovarik ,
RR Unocic ,
D Wei ,
D Mourer  and
MJ Mills
PJ Phillips
Affiliation:
Ohio State University
L Kovarik
Affiliation:
Ohio State University
RR Unocic
Affiliation:
ORNL
D Wei
Affiliation:
GE Aviation
D Mourer
Affiliation:
GE Aviation
MJ Mills
Affiliation:
Ohio State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1798 - 1799
Copyright
Copyright © Microscopy Society of America 2010