Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-04T21:43:54.127Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Electrical Characterization of Single Nanofibers Using a Nanomanipulator in an FIB/SEM Microscope

Published online by Cambridge University Press:  01 August 2010

K Roelofs ,
S Xu ,
G Poirier  and
N Yao
K Roelofs
Affiliation:
Princeton University
S Xu
Affiliation:
Princeton University
G Poirier
Affiliation:
Princeton University
N Yao
Affiliation:
Princeton University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1800 - 1801
Copyright
Copyright © Microscopy Society of America 2010