Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-23T04:34:24.760Z Has data issue: false hasContentIssue false
  • English
  • Français

Methods for TEM Analysis of NIST’s SWCNT SRM

Published online by Cambridge University Press:  01 August 2010

RH Geiss ,
E Mansfield  and
JA Fagan
RH Geiss
Affiliation:
National Institute of Standards and Technology
E Mansfield
Affiliation:
National Institute of Standards and Technology
JA Fagan
Affiliation:
National Institute of Standards and Technology

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1792 - 1793
Copyright
Copyright © Microscopy Society of America 2010