Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T04:39:20.916Z Has data issue: false hasContentIssue false
  • English
  • Français

Strain Relaxation in Planar InAs Epitaxial Layers Studied by High-Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

K Mahalingam ,
KG Eyink ,
M Twyman ,
J Shoaf  and
L Grazulis
K Mahalingam
Affiliation:
Air Force Research Laboratory
KG Eyink
Affiliation:
Air Force Research Laboratory
M Twyman
Affiliation:
Air Force Research Laboratory
J Shoaf
Affiliation:
Air Force Research Laboratory
L Grazulis
Affiliation:
Air Force Research Laboratory

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1786 - 1787
Copyright
Copyright © Microscopy Society of America 2010