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In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias

Published online by Cambridge University Press:  26 July 2009

C Winkler ,
L Martin ,
C Johnson  and
M Taheri
C Winkler
Affiliation:
Drexel University
L Martin
Affiliation:
Lawrence Berkeley National Laboratory
C Johnson
Affiliation:
Drexel University
M Taheri
Affiliation:
Drexel University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 724 - 725
Copyright
Copyright © Microscopy Society of America 2009