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Volume 15 - Supplement S2 - July 2009

Contents

Page 12 of 39

Instrumentation and Techniques

Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF

Abstract

  • Atomic-resolution STEM and variable-temperature EELS Studies of Thermoelectric Ca3Co4O9

  • G Yang, QM Ramasse, RF Klie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 442-443
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantification of Manganese Valence States Using Mn L2,3 Electron Energy-Loss Near-Edge Spectra

  • S Zhang, K Livi, A-C Gaillot, D Veblen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 444-445
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reliable Quantification of EELS Spectra with a Simple Model–Based Approach

  • G Duscher, ME Hmielewski, JDO Oduor
  • Published online by Cambridge University Press:
    26 July 2009, pp. 446-447
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Factors Affecting Elemental Quantification at the atomic Scale Using EELS

  • R Srinivasan, GB Viswanathan, J Sosa, D McComb, J Ringnalda, HL Fraser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 448-449
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Using Neural Network Algorithms for Compositional Mapping in STEM EELS

  • AY Borisevich, SV Kalinin, AR Lupini, S Jesse, HJ Chang, M Hujiben, R Ramesh, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 450-451
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanoscale Imaging of Photonic Densities of States in Finite Photonic Structures

  • JJ Cha, E Smith, M Couillard, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 452-453
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A EELS Sub Nanometer Investigation of the Dielectric Gate Stack for the Realization of InGaAs Based MOSFET Devices

  • P Longo, MC Holland, GW Paterson, AJ Craven, IG Thayne
  • Published online by Cambridge University Press:
    26 July 2009, pp. 454-455
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative STEM-EDS Mapping and Analysis

  • C Parish, L Brewer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 456-457
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?,

  • NJ Zaluzec
  • Published online by Cambridge University Press:
    26 July 2009, pp. 458-459
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • What is the Best Beam Energy for X-Ray Microanalysis of Nanomaterials in Electron Microscopy?

  • R Gauvin, P Michaud, ML Trudeau
  • Published online by Cambridge University Press:
    26 July 2009, pp. 460-461
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Statistical Analysis of Point Defects in Hydrogen Storage Materials

  • MC Sarahan, QM Ramasse, DG Morgan, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 462-463
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

  • S Van Aert, J Verbeeck, S Bals, R Erni, D Van Dyck, S Van Tendeloo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 464-465
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative HAADF Imaging of Crystals Containing Heavy Elements: A Comparison with Theory

  • J LeBeau, S Findlay, X Wang, A Jacobson, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 466-467
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision

  • K Kimoto, K Ishizuka, M Saito, T Nagai, X Yu, R-J Xie, N Hirosaki, Y Matsui
  • Published online by Cambridge University Press:
    26 July 2009, pp. 468-469
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution STEM and EELS Studies of Interfaces of Model Gold-Titanium Dioxide (Au-TiO2) Catalysts

  • S Sivaramakrishnan, J-G Wen, B Pierce, M Scarpelli, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 470-471
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM

  • DC Bell, R Schillinger, S Meyer, P Tayebati
  • Published online by Cambridge University Press:
    26 July 2009, pp. 472-473
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • STEM in SEM For Medium-Resolution X-Ray Microanalysis

  • PG Kotula
  • Published online by Cambridge University Press:
    26 July 2009, pp. 474-475
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Three-dimensional Microanalysis Using FIB SEM: Variations in Technique

  • K Scott, JM Davis, EP Vicenzi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 476-477
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials

  • LA Giannuzzi, BP Gorman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 478-479
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 12 of 39