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Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

S Van Aert ,
J Verbeeck ,
S Bals ,
R Erni ,
D Van Dyck  and
S Van Tendeloo
S Van Aert
Affiliation:
Electron Microscopy for Materials Science,Belgium
J Verbeeck
Affiliation:
Electron Microscopy for Materials Science,Belgium
S Bals
Affiliation:
Electron Microscopy for Materials Science,Belgium
R Erni
Affiliation:
National Center for Electron Microscopy
D Van Dyck
Affiliation:
Electron Microscopy for Materials Science,Belgium
S Van Tendeloo
Affiliation:
Electron Microscopy for Materials Science,Belgium

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 464 - 465
Copyright
Copyright © Microscopy Society of America 2009