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Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision

Published online by Cambridge University Press:  26 July 2009

K Kimoto ,
K Ishizuka ,
M Saito ,
T Nagai ,
X Yu ,
R-J Xie ,
N Hirosaki  and
Y Matsui
K Kimoto
Affiliation:
National Institute for Materials Science,Japan
K Ishizuka
Affiliation:
HREM Research Inc ,Japan
M Saito
Affiliation:
Tohoku University,Japan
T Nagai
Affiliation:
National Institute for Materials Science,Japan
X Yu
Affiliation:
National Institute for Materials Science,Japan
R-J Xie
Affiliation:
National Institute for Materials Science,Japan
N Hirosaki
Affiliation:
National Institute for Materials Science,Japan
Y Matsui
Affiliation:
National Institute for Materials Science,Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 468 - 469
Copyright
Copyright © Microscopy Society of America 2009