STEM in SEM For Medium-Resolution X-Ray Microanalysis

PG Kotula

doi:10.1017/S1431927609099395

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STEM in SEM For Medium-Resolution X-Ray Microanalysis

Published online by Cambridge University Press: 26 July 2009

PG Kotula

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PG Kotula*: Affiliation:
Sandia National Laboratories

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 474 - 475

DOI: https://doi.org/10.1017/S1431927609099395 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2009

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STEM in SEM For Medium-Resolution X-Ray Microanalysis

Volume 15, Supplement S2
PG Kotula ^(a1)
DOI: https://doi.org/10.1017/S1431927609099395

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STEM in SEM For Medium-Resolution X-Ray Microanalysis

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