Reliable Quantification of EELS Spectra with a Simple Model–Based Approach

G Duscher; ME Hmielewski; JDO Oduor

doi:10.1017/S1431927609094884

Reliable Quantification of EELS Spectra with a Simple Model–Based Approach

Published online by Cambridge University Press: 26 July 2009

G Duscher ,

ME Hmielewski and

JDO Oduor

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G Duscher: Affiliation:
University of Tennessee,Knoxville
ME Hmielewski: Affiliation:
University of Tennessee,Knoxville
JDO Oduor: Affiliation:
University of Tennessee,Knoxville

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 446 - 447

DOI: https://doi.org/10.1017/S1431927609094884 [Opens in a new window]

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Reliable Quantification of EELS Spectra with a Simple Model–Based Approach

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